Design to Test: A Definitive Guide for Electronic Design, by John Turino

By John Turino

This publication is the second one version of layout to check. the 1st version, written alone and H. Frank Binnendyk and primary released in 1982, has passed through numerous printings and develop into a typical in lots of businesses, even in a few nations. either Frank and that i are very pleased with the luck that our buyers have had in using the knowledge, it all nonetheless appropriate to present day digital designs. yet six years is decades in any know-how box. I for this reason felt it was once time to jot down a brand new version. This new version, whereas keeping the elemental testability prin­ ciples first documented six years in the past, includes the newest fabric on state of the art testability strategies for digital units, forums, and platforms and has been thoroughly rewritten and up­ dated. bankruptcy 15 from the 1st variation has been switched over to an appendix. bankruptcy 6 has been extended to hide the newest tech­ nology units. bankruptcy 1 has been revised, and several other examples during the publication were revised and up-to-date. yet a few­ occasions the extra issues swap, the extra they remain a similar. the entire instructions and data awarded during this booklet care for the 3 uncomplicated testability principles-partitioning, keep watch over, and visibility. they've got no longer replaced in years. yet many folks have got smarter approximately easy methods to enforce these 3 easy try­ skill rules, and it's the target of this article to enlighten the reader relating to these new (and previous) testability implementation techniques.

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34 SYSTEM GUIDELINES Functional Packaging Each PCB or subassembly should be designed as a properly partitioned, controllable, and observable functional unit, rather than being split up into bits and pieces of logic or circuits on separate modules or subassemblies. When functions are split, particularly in what appears to be a random fashion, it complicates the test equipment, the test programming effort, and the actual testing and troubleshooting tasks. , having each function complete within a single package) will simplify test generation and test operations.

They are especially troublesome when trying to fault isolate definitively to a specific component on a printed circuit board. The purpose of fault isolation is to isolate a fault to a replaceable component. In a logic feedback system, it is impossible to definitively fault isolate with the loop closed. And the larger the loop, the more difficult it becomes to troubleshoot and the larger the potentially defective component ambiguity group becomes. Various techniques can be employed to break up feedback loops, and some of these are shown in Figure 2-7.

This can be detrimental to component life if not used with care. If a testability interface is included in a design, the required reset (or equivalent) lines should be gated such that their states can be changed via the testability interface. Full initialization, one test pattern after power application, should be used as the design goal for initialization. If multiple patterns are required, go/no-go testing can be done, but faults that prevent initialization are extremely difficult to diagnose.

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